The interferometric mirage effect method: The determination of the thermal diffusivity of CdMnTe

A Michelson interferometer was used as a precise detector in the Mirage effect configuration in order to determine the thermal diffusivity of the diluted rnagnetic semiconductor Cd, -,Mn,Te, in the concentration range O<x<0.6 at roorn ternperature. This zinc-blende temary alloy exhibits an alrnost linear behavior of the thermal diffusivity as a function of Mn concentration. This trend is similar to that of the energy gap against Mn concentration, which increases linearly as the nominal x value increases. The latter result was tested by electrolytic electroreflectance measurements. O 2005 Elsevier Ltd. Al1 nghts reserved.